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Are you Yeow, John T.W.?
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Data Type
Year
Canada
SCINET
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Overall Rank
Rank in SubField 1
Publications
Citations
Main Field:
Enabling & Strategic Technologies
SubField 1:
Nanoscience & Nanotechnology
SubField 2:
Industrial Engineering & Automation
Rank in SubField 1: 2,891 out of 156,020 Researchers
Data For The Year: 2025
| Metrics | Self-Citations Excluded | All |
|---|---|---|
| Rank Based on Composite Score | 227,009 | 233,646 |
| Total Cites | 5,277 | 5,878 |
| H-index | 30 | 32 |
| Hm-index | 16 | 19 |
| Number of Single Authored Papers | 27 | 27 |
| Total Cites to Single Authored Papers | 5 | 5 |
| Number of Single+First Authored Papers | 43 | 43 |
| Total Cites to Single+First Authored Papers | 752 | 790 |
| Number of Single+First+Last Authored Papers | 235 | 235 |
| Total Cites to Single+First+Last Authored Papers | 4,526 | 4,965 |
| Composite Score | 3 | 3 |
| Number of Distinct Citing Papers | 4,802 | 5,055 |
| Ratio of Total Citations to Distinct Citing Papers | 1.10 | 1.16 |
| Self-Citation Percentage |
10.22%
|
|
Profile link:
https://topscinet.com/scientist_profile/Yeow,%20John%20T.W./2001/
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